smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.14.0-503.14.1.hlit3.el8.x86_64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Vendor:               HPE
Product:              MR416i-p Gen11
Revision:             5.26
Compliance:           SPC-3
User Capacity:        4,798,283,776,000 bytes [4.79 TB]
Logical block size:   512 bytes
Physical block size:  4096 bytes
Rotation Rate:        Solid State Device
Logical Unit id:      0x600062b21e66d6402f41c79bd6c6aa37
Serial number:        0037aac6d69bc7412f40d6661eb26200
Device type:          disk
Local Time is:        Tue Nov 18 14:04:42 2025 UTC
SMART support is:     Unavailable - device lacks SMART capability.

=== START OF READ SMART DATA SECTION ===
Current Drive Temperature:     0 C
Drive Trip Temperature:        0 C

Error Counter logging not supported

Device does not support Self Test logging
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.14.0-503.14.1.hlit3.el8.x86_64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     MK000480GXNXB
Serial Number:    241247BD3772
LU WWN Device Id: 5 00a075 147bd3772
Firmware Version: HPG0
User Capacity:    480,103,981,056 bytes [480 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    Solid State Device
Form Factor:      2.5 inches
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ACS-3 (minor revision not indicated)
SATA Version is:  SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Tue Nov 18 14:04:43 2025 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		( 1674) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (   6) minutes.
Conveyance self-test routine
recommended polling time: 	 (   3) minutes.
SCT capabilities: 	       (0x0035)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   050    Pre-fail  Always       -       0
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       7223
 11 Unknown_SSD_Attribute   0x0012   100   100   000    Old_age   Always       -       84
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       97
171 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
172 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
173 Unknown_Attribute       0x0033   100   100   010    Pre-fail  Always       -       66
174 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       84
175 Program_Fail_Count_Chip 0x0033   100   100   001    Pre-fail  Always       -       0
180 Unused_Rsvd_Blk_Cnt_Tot 0x003b   100   100   001    Pre-fail  Always       -       0
184 End-to-End_Error        0x0032   100   100   000    Old_age   Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       211
194 Temperature_Celsius     0x0022   075   055   000    Old_age   Always       -       25 (Min/Max 16/45)
196 Reallocated_Event_Count 0x0033   100   100   001    Pre-fail  Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0

SMART Error Log not supported

SMART Self-test Log not supported

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

